Alpao自适应光学软件和即时计算系统 | Holoeye空间光调制器 | ALPAO高速变形镜 | 波前分析仪Phasics | 自适应光学系统 | 数字微反射镜 DMD 数字微镜器件 | 光学元件器件DOE | 光刻仪 |
3D打印系统 | 飞秒激光器 | 皮秒激光器 | 自相关仪 | 超短脉冲测量仪Frog | 超快激光器件 |
高功率连续波OPO | 高功率光纤激光器 | Qioptiq NANO 激光器 | 低噪声窄线宽激光器 | 可调谐激光器 | 半导体激光器和放大器 | SLD和ASE宽带光源 | 双波长输出氦氖激光器 |
QIOPTIQ光纤耦合半导体激光器 | Diode & DPSS_qioptiq | 激光驱动白光光源 | 等离子体宽带光源 | 单色仪 | 光谱仪 | 光栅 | 辐射计 | 防嗮系数分析 | Optogma固体激光器 | Solarlight | 波长选择器 |
激光准直仪 | 红外激光观察镜 | 激光功率能量计 | 光学斩波器 | 光束质量分析仪 | 位敏探测器 | 红外相机 | O/E转换模块探测器 TIA-525S |
太赫兹相机及源 | 太赫兹探测器 | 太赫兹元器件及晶体 | 太赫兹光谱仪 | 太赫兹功率计 |
Optiphase | 微光MOI |
普克尔盒/Pockels Cells | 电光调制器/Electro-Optics Modulators | 法拉第隔离器/Faraday Isolators | SESAM半导体可饱和吸收镜 | 探测器 | EOT高速光电探测器 | 其他未分类 |
电化学ECV 扩散浓度 | 接触电阻测量仪 | 四点探针测试仪 | 少子寿命测试仪 |
平行光管 |
光纤跳线及配件 | 无源器件 |
![]() | SID4 V VacuumPhasics is innovating by proposing the first off-the-shelf vacuum compatible wavefront sensor on the market. The SID4 V is designed to perform wavefront measurements under high vacuum. the wavefront measurement is realized in-situ in the same condition as |
![]() | IMRA光纤耦合输出高功率飞秒激光器FD/D-FD-1000SFD系列激光器采用光纤耦合输出,在保证脉冲质量前提下将脉冲灵活地输送到用户想要的地方。2015年IMRA推出了主要针对1045nm蛋白成像应用的1um光纤耦合输出飞秒激光器,由于其输出的灵活性,这款光纤耦合产品已广泛应用于其他应用。FD/D-FD-1000S提供超过1W的平均功率,脉宽<200fs。激光器采用风冷一体式设计,可轻松集成到工作站和激光系统中。目标应用包括双光子显微和二次谐波成像。 |
![]() | SID4 UVCOST-EFFECTIVE UV WAVEFRONT SENSOR | High resolution (62 500 phase pixels) |
![]() | SID4HIGH RESOLUTION WAVEFRONT SENSOR | 400-1100 nm |
![]() | SID4 HRUNRIVALLED HIGH RESOLUTION | 400×300 phase pixels |
![]() | SID4 NIRHIGH RESOLUTION PHASE & INTENSITY | at 1.55 µm |
![]() | SID4 SWIRCOST-EFFECTIVE | HIGH RESOLUTION + HIGH SENSITIVITY |for shortwave infrared |
![]() | SID4 SWIR-HRHIGH RESOLUTION + HIGH SENSITIVITY | for shortwave infrared |
![]() | SID4-eSWIRHIGH RESOLUTION EXTENDED SWIR WAVE FRONT SENSOR |
![]() | SID4 LWIRHIGH RESOLUTION PHASE & INTENSITY | in the far infrared region |
![]() | SID4 DWIRPhasics introduces the first off-the-shelf high resolution wave front sensor for dual band infrared from 3 to 5 µm and 8 to 14 µm. The SID4 DWIR measures laser beam at 3.39µm and 10.6µm or source of any wavelength in between 3-5 µm and 8-14 µm such as bla |
![]() | SID4-sC8Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution. Biologists will benefit from label-free cell imaging, high sensitivity and automat |
![]() | SID4BioThe SID4Bio is a plug & play camera for quantitative phase imaging. It works with any microscope and enables measuring valuable numerical parameters on live cells. |
![]() | SID4 ElementADVANCED ADD-ON | for quantitative phase microscopy |
![]() | KaleoMultiWAVEThe Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. The KaleoMultiWAVE works at different wavelengths to perfor |
![]() | IMRA掺铒800nm飞秒光纤激光器Femtolite系列F/G/HIMRA掺铒800nm飞秒光纤激光器Femtolite系列F/G/H IMRA的Raman-shifted拉曼位移技术,在810 nm的独特波长下拥有干净的脉冲形状和光谱,这使Femtolite可成为普遍存在的Ti:Sapphire激光器的优秀替代品。超紧凑稳定设计使得Femtolite飞秒激光器可应用于临床和工业环境。自2005年推出以来,Femtolite已得到广泛应用功率可达150mW@810nm/200mW@1620nm。目标应用包括太赫兹产生和探测、多光子荧光显微和二次谐波成像等 |
![]() | KaleoMTF for R&DThe KaleoMTF bench performs automated off-axis MTF and wavefront error measurements at multiple wavelengths. It also measures aberrations (Zernike coefficients), through focus MTF, distortion, EFL… All results are given in the lens exit pupil for accurate |
![]() | Kaleo IRPhasics bench makes infrared lens quality control very simple. IR MTF is obtained in a single shot at all frequencies with no need for scanning or complex alignment. All wavefront aberrations are also provided with this single acquisition. The Kaleo IR Be |
![]() | Kaleo iThe Kaleo-I instrument is especially designed for the quality control of refractive intraocular lens, whether spherical, aspheric, toric or bifocal. It achieves fast and reliable measurements thanks to the integration of our high resolution wavefront sens |
![]() | Lyncee Tec MEMS全息测振分析仪Lyncee Tec MEMS全息测振分析仪 全息MEMS测振分析仪记录MEMS振动周期中的三维形貌时序图,为MEMS振动测量提供了 的丰富数据,特别是可以在被测视场内任意一点测量面内和面外振幅(位移)及频率响应,这些独特优势与完善的配套软、硬件一起提供了一套完整的MEMS振动测量解决方案。 |