COST-EFFECTIVE | HIGH RESOLUTION + HIGH SENSITIVITY |for shortwave infrared
The SID4 SWIR wavefront sensor integrates Phasics patented technology
with a high quality InGaAs detector. It ensures accurate wavefront
analysis in SWIR source and lens testing.
- Extended spectral range from 0.9 to 1.7µm – the SID4 SWIR covers NIR and SWIR regions without any calibration
- Resolution – 80 x 64 phase pixels
- High sensitivity – < 2nm phase noise through the whole spectral range – the SID4 SWIR is suitable to low energy IR sources
- Compact and self-referenced for an easy set-up
Specifications
| Wavelength range | 0.9 – 1.7 µm
|
| Aperture dimension | 9.60 x 7. 68 mm2 |
| Spatial resolution | 120 µm |
| Phase & intensity sampling | 80 x 64 |
| Resolution (Phase) | < 2 nm RMS |
| Acquisition rate | 120 fps |
| Accuracy | 15 nm RMS |
| Real-time processing frequency | 7 fps (full resolution) |
| Computer connection | Giga Ethernet |
| Dimensions (w x h x l) | 100 x 55 x 63 mm |
| Weight | ~ 455 g |
