HIGH RESOLUTION EXTENDED SWIR WAVE FRONT SENSOR
The SID4-eSWIR wave front sensor
integrates PHASICS patented technology with a T2SL detector. Thanks to
its high spatial resolution and great sensitivity, it offers accurate
wave front measurement over the extended SWIR range from 1.0 to 2.35 µm
SID4-eSWIR is an innovative solution for testing SWIR sources
and lenses used in optical communications, inspection instruments or
night vision in military and surveillance devices. It provides both MTF
and aberrations in one single shot measurement.
Applications: Free-space optical communication | Defense & Security | Aerospace
Specifications
Wavelength range | 1.0-2.35 µm |
Aperture dimensions | 9.6 x 7.68 mm² |
Phase spatial resolution | 120 μm |
Phase & Intensity sampling | 80 x 64 |
Resolution (Phase) | < 6 nm RMS* |
Accuracy | < 40 nm RMS* |
Real-time processing frequency | > 10 Hz (full resolution) |
Interface | USB 2.0 |
Dimensions | 90 x 115 x 120 mm |
Weight | ~ 1.8 kg |