繁體中文
订购热线:021-3463-5258 021-3463-5259
订购热线:021-3463-5258 021-3463-5259
| Holoeye空间光调制器 | ALPAO高速变形镜 | 波前分析仪Phasics | 自适应光学系统 | 数字微反射镜 DMD 数字微镜器件 | 光学元件器件DOE | 光刻仪 |
| 飞秒激光器 | 皮秒激光器 | 自相关仪 | 超短脉冲测量仪Frog | 超快激光器件 |
| 高功率连续波OPO | 高功率光纤激光器 | Qioptiq NANO 激光器 | 低噪声窄线宽激光器 | 可调谐激光器 | 半导体激光器和放大器 | SLD和ASE宽带光源 | 双波长输出氦氖激光器 |
| QIOPTIQ光纤耦合半导体激光器 | Diode & DPSS_qioptiq | 激光驱动白光光源 | 等离子体宽带光源 | 单色仪 | 光谱仪 | 光栅 | 辐射计 | 防嗮系数分析 | Optogma固体激光器 | Solarlight | 波长选择器 |
| 激光准直仪 | 红外激光观察镜 | 激光功率能量计 | 光学斩波器 | 光束质量分析仪 | 位敏探测器 | 红外相机 | O/E转换模块探测器 TIA-525S |
| 太赫兹相机及源 | 太赫兹探测器 | 太赫兹元器件及晶体 | 太赫兹光谱仪 | 太赫兹功率计 |
| Optiphase | 微光MOI |
| 普克尔盒/Pockels Cells | 电光调制器/Electro-Optics Modulators | 法拉第隔离器/Faraday Isolators | SESAM半导体可饱和吸收镜 | 探测器 | EOT高速光电探测器 | 其他未分类 |
| 电化学ECV 扩散浓度 | 接触电阻测量仪 | 四点探针测试仪 | 少子寿命测试仪 |
| 平行光管 |
| 光纤跳线及配件 | 无源器件 |
 | SID4 LWIRHIGH RESOLUTION PHASE & INTENSITY | in the far infrared region |
 | SID4 DWIRPhasics introduces the first off-the-shelf high resolution wave front sensor for dual band infrared from 3 to 5 µm and 8 to 14 µm. The SID4 DWIR measures laser beam at 3.39µm and 10.6µm or source of any wavelength in between 3-5 µm and 8-14 µm such as bla |
 | SID4-sC8Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution. Biologists will benefit from label-free cell imaging, high sensitivity and automat |
 | SID4BioThe SID4Bio is a plug & play camera for quantitative phase imaging. It works with any microscope and enables measuring valuable numerical parameters on live cells. |
 | SID4 ElementADVANCED ADD-ON | for quantitative phase microscopy |
 | KaleoMultiWAVEThe Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. The KaleoMultiWAVE works at different wavelengths to perfor |
 | KaleoMTF for R&DThe KaleoMTF bench performs automated off-axis MTF and wavefront error measurements at multiple wavelengths. It also measures aberrations (Zernike coefficients), through focus MTF, distortion, EFL… All results are given in the lens exit pupil for accurate |
 | Kaleo IRPhasics bench makes infrared lens quality control very simple. IR MTF is obtained in a single shot at all frequencies with no need for scanning or complex alignment. All wavefront aberrations are also provided with this single acquisition. The Kaleo IR Be |
 | Kaleo iThe Kaleo-I instrument is especially designed for the quality control of refractive intraocular lens, whether spherical, aspheric, toric or bifocal. It achieves fast and reliable measurements thanks to the integration of our high resolution wavefront sens |