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订购热线:021-3463-5258 021-3463-5259
| Holoeye空间光调制器 | ALPAO高速变形镜 | 波前分析仪Phasics | 自适应光学系统 | 数字微反射镜 DMD 数字微镜器件 | 光学元件器件DOE | 光刻仪 |
| 飞秒激光器 | 皮秒激光器 | 自相关仪 | 超短脉冲测量仪Frog | 超快激光器件 |
| 高功率连续波OPO | 高功率光纤激光器 | Qioptiq NANO 激光器 | 低噪声窄线宽激光器 | 可调谐激光器 | 半导体激光器和放大器 | SLD和ASE宽带光源 | 双波长输出氦氖激光器 |
| QIOPTIQ光纤耦合半导体激光器 | Diode & DPSS_qioptiq | 激光驱动白光光源 | 等离子体宽带光源 | 单色仪 | 光谱仪 | 光栅 | 辐射计 | 防嗮系数分析 | Optogma固体激光器 | Solarlight | 波长选择器 |
| 激光准直仪 | 红外激光观察镜 | 激光功率能量计 | 光学斩波器 | 光束质量分析仪 | 位敏探测器 | 红外相机 | O/E转换模块探测器 TIA-525S |
| 太赫兹相机及源 | 太赫兹探测器 | 太赫兹元器件及晶体 | 太赫兹光谱仪 | 太赫兹功率计 |
| Optiphase | 微光MOI |
| 普克尔盒/Pockels Cells | 电光调制器/Electro-Optics Modulators | 法拉第隔离器/Faraday Isolators | SESAM半导体可饱和吸收镜 | 探测器 | EOT高速光电探测器 | 其他未分类 |
| 电化学ECV 扩散浓度 | 接触电阻测量仪 | 四点探针测试仪 | 少子寿命测试仪 |
| 平行光管 |
| 光纤跳线及配件 | 无源器件 |
 | 衍射投影套件Holoeye提供各种以硅基液晶为基础的空间光调制器。从紫外到红外，这些调制设备覆盖了非常宽的波段。近年来，在可见光波段的应用日益广泛，特别是用于AR/VR，或者抬头显示器里的广泛应用，使得相对于传统透镜组，计算全息成像的优势愈发明显——在投影中，除了通常的光学投影，还可以方便高效地修正各种相差，或者实现动态聚焦。对此，Holoeye提供了搭配其空间调试器（SLM）所使用的衍射投影套件。只需要用保偏光纤导入线偏激光，即可得到衍射成像投影。目前，套件支持Holoeye公司的Pluto-2、Leto、Gaea |
 | TMS温度控制系统Holoeye有性能优异的PLUTO-2系列和GAEA-2系列液晶面板。但是，由于液晶的固有性质，为了达到最好的效果，需要保持理想的温度，因此，TMS系列温控系统就应运而生了。 新一代的PLUTO-2和GAEA-2为了解决液晶发热问题，已经自带了基本的热沉支架，但为了适应高功率和高精度的液晶调节，Holoeye公司开发了可以附加安装的温控系统。 MS001系统可以用于在实验室温度下，将液晶温度保持在呈下行工作温度下（30到35摄氏度）。 但对在高强度激光下使用的液晶，TMS 002则是更合适的选择。 |
 | Luna系列 紧凑型 空间光调制器LUNA纯相位空间光调制器是基于液晶微显示技术，分辨率可达1920x1080像素。像元大小4.5μm。LUNA纯相位空间光调制器提供可见光波段和通信波段的型号可供选择，覆盖从400nm到1700nm的波长。对所有波长的调制范围都大于一个完整波长（2π），响应时间小于20ms LUNA系列具有尺寸小、集成度高的特点。液晶面板尺为8.64*4.86mm，驱动盒的尺寸仅有44*85*23.5mm。驱动盒提供最新的DP接口和显示适配器相连接，使用USB接口进行高级设置。 由于内建集成ASIC，LUNA系列本身即 |
 | Kaleo MTF Measurement StationPhasics innovative solution delivers the most complete lens characterization: off-axis MTF and wavefront error at multiple wavelengths. It benefits from Phasics patented technology to provide accurate results even for large Field of View (FoV). Kaleo MTF |
 | SID4 UVCOST-EFFECTIVE UV WAVEFRONT SENSOR | High resolution (62 500 phase pixels) Very high resolution – 250×250 phase map High sensitivity – 2 nm RMS Affordable solution for UV wavefront measurement Perfectly adapted for UV optics testing, UV |
 | SID4 V VacuumPhasics is innovating by proposing the first off-the-shelf vacuum compatible wavefront sensor on the market. The SID4 V is designed to perform wavefront measurements under high vacuum. the wavefront measurement is realized in-situ in the same condition as |
 | SID4 UVCOST-EFFECTIVE UV WAVEFRONT SENSOR | High resolution (62 500 phase pixels) |
 | SID4HIGH RESOLUTION WAVEFRONT SENSOR | 400-1100 nm |
 | SID4 HRUNRIVALLED HIGH RESOLUTION | 400×300 phase pixels |
 | SID4 NIRHIGH RESOLUTION PHASE & INTENSITY | at 1.55 µm |
 | SID4 SWIRCOST-EFFECTIVE | HIGH RESOLUTION + HIGH SENSITIVITY |for shortwave infrared |
 | SID4 SWIR-HRHIGH RESOLUTION + HIGH SENSITIVITY | for shortwave infrared |
 | SID4-eSWIRHIGH RESOLUTION EXTENDED SWIR WAVE FRONT SENSOR |
 | SID4 LWIRHIGH RESOLUTION PHASE & INTENSITY | in the far infrared region |
 | SID4 DWIRPhasics introduces the first off-the-shelf high resolution wave front sensor for dual band infrared from 3 to 5 µm and 8 to 14 µm. The SID4 DWIR measures laser beam at 3.39µm and 10.6µm or source of any wavelength in between 3-5 µm and 8-14 µm such as bla |
 | SID4-sC8Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution. Biologists will benefit from label-free cell imaging, high sensitivity and automat |
 | SID4BioThe SID4Bio is a plug & play camera for quantitative phase imaging. It works with any microscope and enables measuring valuable numerical parameters on live cells. |
 | SID4 ElementADVANCED ADD-ON | for quantitative phase microscopy |
 | KaleoMultiWAVEThe Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. The KaleoMultiWAVE works at different wavelengths to perfor |
 | KaleoMTF for R&DThe KaleoMTF bench performs automated off-axis MTF and wavefront error measurements at multiple wavelengths. It also measures aberrations (Zernike coefficients), through focus MTF, distortion, EFL… All results are given in the lens exit pupil for accurate |