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Kaleo i  
Kaleo i
The Kaleo-I instrument is especially designed for the quality control of refractive intraocular lens, whether spherical, aspheric, toric or bifocal. It achieves fast and reliable measurements thanks to the integration of our high resolution wavefront sens
Kaleo IR  
Kaleo IR
Phasics bench makes infrared lens quality control very simple. IR MTF is obtained in a single shot at all frequencies with no need for scanning or complex alignment. All wavefront aberrations are also provided with this single acquisition. The Kaleo IR Be
KaleoMTF for R&D  
KaleoMTF for R&D
The KaleoMTF bench performs automated off-axis MTF and wavefront error measurements at multiple wavelengths. It also measures aberrations (Zernike coefficients), through focus MTF, distortion, EFL… All results are given in the lens exit pupil for accurate
KaleoMultiWAVE  
KaleoMultiWAVE
The Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. The KaleoMultiWAVE works at different wavelengths to perfor
SID4 Element  
SID4 Element
ADVANCED ADD-ON | for quantitative phase microscopy
SID4Bio  
SID4Bio
The SID4Bio is a plug & play camera for quantitative phase imaging. It works with any microscope and enables measuring valuable numerical parameters on live cells.
SID4-sC8  
SID4-sC8
Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution. Biologists will benefit from label-free cell imaging, high sensitivity and automat
SID4 DWIR  
SID4 DWIR
Phasics introduces the first off-the-shelf high resolution wave front sensor for dual band infrared from 3 to 5 µm and 8 to 14 µm. The SID4 DWIR measures laser beam at 3.39µm and 10.6µm or source of any wavelength in between 3-5 µm and 8-14 µm such as bla
SID4 LWIR  
SID4 LWIR
HIGH RESOLUTION PHASE & INTENSITY | in the far infrared region
SID4-eSWIR  
SID4-eSWIR
HIGH RESOLUTION EXTENDED SWIR WAVE FRONT SENSOR
SID4 SWIR-HR  
SID4 SWIR-HR
HIGH RESOLUTION + HIGH SENSITIVITY | for shortwave infrared
SID4 SWIR  
SID4 SWIR
COST-EFFECTIVE | HIGH RESOLUTION + HIGH SENSITIVITY |for shortwave infrared
SID4  
SID4
HIGH RESOLUTION WAVEFRONT SENSOR | 400-1100 nm
SID4 UV  
SID4 UV
COST-EFFECTIVE UV WAVEFRONT SENSOR | High resolution (62 500 phase pixels)
SID4 V Vacuum  
SID4 V Vacuum
Phasics is innovating by proposing the first off-the-shelf vacuum compatible wavefront sensor on the market. The SID4 V is designed to perform wavefront measurements under high vacuum. the wavefront measurement is realized in-situ in the same condition as
Kaleo MTF Measurement Station  
Kaleo MTF Measurement Station
Phasics innovative solution delivers the most complete lens characterization: off-axis MTF and wavefront error at multiple wavelengths. It benefits from Phasics patented technology to provide accurate results even for large Field of View (FoV). Kaleo MTF
Phasics公司Kaleo光学传递函数测量仪  
Phasics公司Kaleo光学传递函数测量仪
法国 Phasics公司提供Kaleo光学传递函数测量仪,其能提供最完整的透镜特性测试方案,包括离轴MTF和宽波长的波前误差测试。这个系列的MTF测试仪可用于镜头测试,光学表面测试。Kaleo IR 红外透镜的质量控制及测试系统,提供多个红外波长的测试方案。Kaleo MTF for R&D测试仪对于研发的特点是多个波长下进行自动离轴MTF以及波前误差测试。Kaleo i是一款人工晶状体质量控制测试仪。
法国Phasics推出真空环境兼容波前分析仪SID4-V  
法国Phasics推出真空环境兼容波前分析仪SID4-V
为满足广大客户在真空环境中对激光光束质量,气流,等离子体密度测量分析,以及光学系统装配的需求。法国phasics推出了新型高精度波前分析仪sid4-v,是目前市场上仅有一款可应用于真空度在10-6 mbar环境中的波前分析仪,广泛应用于高功率激光测试中
phasics SID4 IR-MCT波前传感器  
phasics SID4 IR-MCT波前传感器
SID4 IR-MCT集成了 Phasics四波横向剪切干涉专利技术和新一代冷却MCT探测系统。这种独特的波前像差分析仪提供了一个非常高分辨率和超高灵敏度,波长范围跨越中波和短波红外范围(从1.2到5.5µµm m)。非常适合微弱光红外光源,如物镜和透镜测试的黑体源或FTIR激光束测量。
SID4 UV-HR 波前传感器Phasics  
SID4 UV-HR 波前传感器Phasics
法国PHASICS公司自主研发的波前传感器是基于四波横向剪切干涉技术。SID4系列波前分析仪相较传统的夏克-哈特曼波前探测器具有高分辨率、消色差、高灵敏度、高动态检测范围、操作简便等独特的优势。为波前像差、波前畸变的检测以及激光光束及波前的测量、分析,眼科虹膜定位波前像差引导等提供了全新的解决方案!
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